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Rasterelektronenmikroskop Leo 1430 VP

Scanning electron microscope Leo 1430 VP

Location: 26.02.01.69

For the imaging of three-dimensional surfaces, the Leo 1430 VP, a standard scanning electron microscope (SEM) with secondary electron detector, is available. It can be operated with an acceleration voltage of up to 30 kV and also has a low vacuum mode.

For setting up sample preparations such as critical-point drying (CPD), sputter-coating etc., please contact our team.

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