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Transmission Electron Microscope JEOL JEM-2100Plus

The JEOL JEM-2100Plus transmission electron microscope (TEM) gives the opportunity to image objects with magnifications up to 1,500,000-fold. Providing the option to perform measurements at acceleration voltages of 80 kV and 200 kV with resolutions up to 0.14 nm, the microscope not only allows imaging of sensitive samples at lower magnifications but also nano-objects with atomic resolution. Beside the option to perform bright-field measurements, the microscope also provides additional modes of operation. While TEM-Tomography attempts to reconstruct 3D objects from 2D projection images taken at different viewing angles, cryo-TEM offers the possibility to examine samples that would change when dried during conventional sample preparation. Scanning TEM, in brightfield and darkfield, together with a detector for energy-dispersive X-ray spectroscopy (EDX), allows elemental analysis on a microscopic scale.

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